OOF
This entry published by the Free Software Foundation.
OOF
http://www.ctcms.nist.gov/oof/index.html
'OOF' helps materials scientists calculate macroscopic properties from images of real or simulated microstructures. It consists of two cooperating parts: 'ppm2oof' and 'oof'. 'ppm2oof' reads images in the ppm (Portable Pixel Map) format and assigns material properties to features in the image. 'oof' conducts virtual experiments on the data structures created by ppm2oof to determine the macroscopic properties of the microstructure. There are now two separate versions of OOF available. The original version solves elasticity problems. The new thermal version solves elasticity and thermal diffusion problems. Plans are to include eventually include electric and magnetic field calculations as well.
Documentation
User manual available in HTML format from http://www.ctcms.nist.gov/oof/download/Manual/Manual.html; User manual available in PDF format from http://www.ctcms.nist.gov/oof/download/Manual.ps.gz
Licensing
| License | Verified by | Verified on | Notes |
|---|---|---|---|
| GPL | Janet Casey | 2452831.511 July 2003 |
Leaders and contributors
| Contact(s) | Role |
|---|---|
| Maintainer |
Resources and communication
| Audience | Resource type | URI |
|---|---|---|
| Bug Tracking,Developer,Support | mailto:oof_manager@ctcms.nist.gov |
Software prerequisites
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This entry (in part or in whole) was last reviewed on 7 January 2008.
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This page was last modified on 12 April 2011, at 13:49.