OOF
OOF
http://www.ctcms.nist.gov/oof/index.html
Calculate macroscopic properties from images of microstructures
'OOF' helps materials scientists calculate macroscopic properties from images of real or simulated microstructures. It consists of two cooperating parts: 'ppm2oof' and 'oof'. 'ppm2oof' reads images in the ppm (Portable Pixel Map) format and assigns material properties to features in the image. 'oof' conducts virtual experiments on the data structures created by ppm2oof to determine the macroscopic properties of the microstructure. There are now two separate versions of OOF available. The original version solves elasticity problems. The new thermal version solves elasticity and thermal diffusion problems. Plans are to include eventually include electric and magnetic field calculations as well.
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Leaders and contributors
| Contact(s) | Role |
|---|---|
| Maintainer |
Resources and communication
| Audience | Resource type | URI |
|---|---|---|
| Bug Tracking,Developer,Support | mailto:oof_manager@ctcms.nist.gov |
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Permission is granted to copy, distribute and/or modify this document under the terms of the GNU Free Documentation License, Version 1.3 or any later version published by the Free Software Foundation; with no Invariant Sections, no Front-Cover Texts, and no Back-Cover Texts. A copy of the license is included in the page “GNU Free Documentation License”.
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