Difference between revisions of "Spatstat"

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(Added Debian link)
(R (Ref))
 
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tests) and model diagnostics (including simulation envelopes,
 
tests) and model diagnostics (including simulation envelopes,
 
residuals, residual plots and Q-Q plots).
 
residuals, residual plots and Q-Q plots).
|Homepage URL=http://cran.r-project.org/web/packages/spatstat/
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|Homepage URL=https://cran.r-project.org/web/packages/spatstat
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|Is High Priority Project=No
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|Decommissioned/Obsolete=No
 
|Accepts cryptocurrency donations=No
 
|Accepts cryptocurrency donations=No
 
|Version identifier=1.37-0-1
 
|Version identifier=1.37-0-1
 
|Version download=http://ftp.debian.org/debian/pool/main/r/r-cran-spatstat/r-cran-spatstat_1.37-0.orig.tar.gz
 
|Version download=http://ftp.debian.org/debian/pool/main/r/r-cran-spatstat/r-cran-spatstat_1.37-0.orig.tar.gz
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|Test entry=No
 
|Last review by=Bendikker
 
|Last review by=Bendikker
|Last review date=2018/03/21
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|Last review date=2018/04/19
 
|Submitted date=2015-07-17
 
|Submitted date=2015-07-17
 
|Is GNU=No
 
|Is GNU=No
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}}
 
}}
 
{{Resource
 
{{Resource
|Resource kind=Download
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|Resource audience=R (Ref)
|Resource URL=http://cran.r-project.org/web/packages/spatstat/
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|Resource URL=https://cran.r-project.org/web/packages/spatstat
 
}}
 
}}
 
{{Software category}}
 
{{Software category}}

Latest revision as of 14:48, 19 April 2018


[edit]

Spatstat

https://cran.r-project.org/web/packages/spatstat
GNU R Spatial Point Pattern analysis, model-fitting, simulation, tests

A GNU R package for analysing spatial data, mainly Spatial Point Patterns, including multitype/marked points and spatial covariates, in any two-dimensional spatial region. Contains functions for plotting spatial data, exploratory data analysis, model-fitting, simulation, spatial sampling, model diagnostics, and formal inference. Data types include point patterns, line segment patterns, spatial windows, and pixel images. Point process models can be fitted to point pattern data. Cluster type models are fitted by the method of minimum contrast. Very general Gibbs point process models can be fitted to point pattern data using a function ppm similar to lm or glm. Models may include dependence on covariates, interpoint interaction and dependence on marks. Fitted models can be simulated automatically. Also provides facilities for formal inference (such as chi-squared tests) and model diagnostics (including simulation envelopes, residuals, residual plots and Q-Q plots).





Licensing

License

Verified by

Verified on

Notes

License

Other

Verified by

Debian: Andreas Tille <tille@debian.org>

Verified on

22 June 2014

Notes

License: gpl2




Leaders and contributors

Contact(s)Role
Adrian Baddeley contact


Resources and communication

AudienceResource typeURI
R (Ref)https://cran.r-project.org/web/packages/spatstat
Debian (Ref) (R)https://tracker.debian.org/pkg/r-cran-spatstat


Software prerequisites




Entry








"contact" is not in the list (Maintainer, Contributor, Developer, Sponsor, Unknown) of allowed values for the "Role" property.


"Debian (Ref) (R)" is not in the list (General, Help, Bug Tracking, Support, Developer) of allowed values for the "Resource audience" property.


"R (Ref)" is not in the list (General, Help, Bug Tracking, Support, Developer) of allowed values for the "Resource audience" property.






Date 2015-07-17
Source Debian
Source link http://packages.debian.org/sid/r-cran-spatstat

[[Category:]]



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The copyright and license notices on this page only apply to the text on this page. Any software or copyright-licenses or other similar notices described in this text has its own copyright notice and license, which can usually be found in the distribution or license text itself.