Difference between revisions of "Spatstat"
(Added Debian link) |
(R (Ref)) |
||
Line 18: | Line 18: | ||
tests) and model diagnostics (including simulation envelopes, | tests) and model diagnostics (including simulation envelopes, | ||
residuals, residual plots and Q-Q plots). | residuals, residual plots and Q-Q plots). | ||
− | |Homepage URL= | + | |Homepage URL=https://cran.r-project.org/web/packages/spatstat |
+ | |Is High Priority Project=No | ||
+ | |Decommissioned/Obsolete=No | ||
|Accepts cryptocurrency donations=No | |Accepts cryptocurrency donations=No | ||
|Version identifier=1.37-0-1 | |Version identifier=1.37-0-1 | ||
|Version download=http://ftp.debian.org/debian/pool/main/r/r-cran-spatstat/r-cran-spatstat_1.37-0.orig.tar.gz | |Version download=http://ftp.debian.org/debian/pool/main/r/r-cran-spatstat/r-cran-spatstat_1.37-0.orig.tar.gz | ||
+ | |Test entry=No | ||
|Last review by=Bendikker | |Last review by=Bendikker | ||
− | |Last review date=2018/ | + | |Last review date=2018/04/19 |
|Submitted date=2015-07-17 | |Submitted date=2015-07-17 | ||
|Is GNU=No | |Is GNU=No | ||
Line 44: | Line 47: | ||
}} | }} | ||
{{Resource | {{Resource | ||
− | |Resource | + | |Resource audience=R (Ref) |
− | |Resource URL= | + | |Resource URL=https://cran.r-project.org/web/packages/spatstat |
}} | }} | ||
{{Software category}} | {{Software category}} |
Latest revision as of 14:48, 19 April 2018
Spatstat
https://cran.r-project.org/web/packages/spatstat
GNU R Spatial Point Pattern analysis, model-fitting, simulation, tests
A GNU R package for analysing spatial data, mainly Spatial Point Patterns, including multitype/marked points and spatial covariates, in any two-dimensional spatial region. Contains functions for plotting spatial data, exploratory data analysis, model-fitting, simulation, spatial sampling, model diagnostics, and formal inference. Data types include point patterns, line segment patterns, spatial windows, and pixel images. Point process models can be fitted to point pattern data. Cluster type models are fitted by the method of minimum contrast. Very general Gibbs point process models can be fitted to point pattern data using a function ppm similar to lm or glm. Models may include dependence on covariates, interpoint interaction and dependence on marks. Fitted models can be simulated automatically. Also provides facilities for formal inference (such as chi-squared tests) and model diagnostics (including simulation envelopes, residuals, residual plots and Q-Q plots).
Download
http://ftp.debian.org/debian/pool/main/r/r-cran-spatstat/r-cran-spatstat_1.37-0.orig.tar.gz
Categories
Licensing
License
Verified by
Verified on
Notes
License
Verified by
Debian: Andreas Tille <tille@debian.org>
Verified on
22 June 2014
Notes
License: gpl2
Leaders and contributors
Contact(s) | Role |
---|---|
Adrian Baddeley | contact |
Resources and communication
Audience | Resource type | URI |
---|---|---|
R (Ref) | https://cran.r-project.org/web/packages/spatstat | |
Debian (Ref) (R) | https://tracker.debian.org/pkg/r-cran-spatstat |
Software prerequisites
Permission is granted to copy, distribute and/or modify this document under the terms of the GNU Free Documentation License, Version 1.3 or any later version published by the Free Software Foundation; with no Invariant Sections, no Front-Cover Texts, and no Back-Cover Texts. A copy of the license is included in the page “GNU Free Documentation License”.
The copyright and license notices on this page only apply to the text on this page. Any software or copyright-licenses or other similar notices described in this text has its own copyright notice and license, which can usually be found in the distribution or license text itself.