Spatstat

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Spatstat

https://cran.r-project.org/web/packages/spatstat
GNU R Spatial Point Pattern analysis, model-fitting, simulation, tests

A GNU R package for analysing spatial data, mainly Spatial Point Patterns, including multitype/marked points and spatial covariates, in any two-dimensional spatial region. Contains functions for plotting spatial data, exploratory data analysis, model-fitting, simulation, spatial sampling, model diagnostics, and formal inference. Data types include point patterns, line segment patterns, spatial windows, and pixel images. Point process models can be fitted to point pattern data. Cluster type models are fitted by the method of minimum contrast. Very general Gibbs point process models can be fitted to point pattern data using a function ppm similar to lm or glm. Models may include dependence on covariates, interpoint interaction and dependence on marks. Fitted models can be simulated automatically. Also provides facilities for formal inference (such as chi-squared tests) and model diagnostics (including simulation envelopes, residuals, residual plots and Q-Q plots).





Licensing

License

Verified by

Verified on

Notes

License

Other

Verified by

Debian: Andreas Tille <tille@debian.org>

Verified on

22 June 2014

Notes

License: gpl2




Leaders and contributors

Contact(s)Role
Adrian Baddeley contact


Resources and communication

AudienceResource typeURI
R (Ref)https://cran.r-project.org/web/packages/spatstat
Debian (Ref) (R)https://tracker.debian.org/pkg/r-cran-spatstat


Software prerequisites




Entry




Date 2015-07-17
Source Debian
Source link http://packages.debian.org/sid/r-cran-spatstat

[[Category:]]





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